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Wafer-Level Fabrication of a Fused-Quartz Double-Ended Tuning Fork Resonator Oscillator Using Quartz-on-Quartz Direct Bonding

Authors
Song, Eun-SeokKang, SungmukKim, HoseongKim, Yong-KweonAn, Jun-EonBaek, Chang-Wook
Issue Date
May-2013
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
double-ended tuning fork (DETF) resonator; fused quartz; micromechanical resonator oscillator; quartz-on-quartz bonding
Citation
IEEE ELECTRON DEVICE LETTERS, v.34, no.5, pp 692 - 694
Pages
3
Journal Title
IEEE ELECTRON DEVICE LETTERS
Volume
34
Number
5
Start Page
692
End Page
694
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/14673
DOI
10.1109/LED.2013.2253753
ISSN
0741-3106
1558-0563
Abstract
In this letter, a novel process to fabricate high-Q fused-quartz micromechanical resonators is demonstrated. Plasma-assisted quartz-on-quartz direct bonding at a low temperature in combination with quartz deep-reactive ion etching technique enables a simple wafer-level fabrication of self-mounted, electrostatically driven fused-quartz resonators. A 27-kHz capacitively transduced double-ended tuning fork fused-quartz resonator oscillator is successfully fabricated using the developed process. A high resonator Q-factor of 68 000 is obtained, and the constructed oscillator shows a signal-to-noise ratio of 70 dB.
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