Wafer-Level Fabrication of a Fused-Quartz Double-Ended Tuning Fork Resonator Oscillator Using Quartz-on-Quartz Direct Bonding
- Authors
- Song, Eun-Seok; Kang, Sungmuk; Kim, Hoseong; Kim, Yong-Kweon; An, Jun-Eon; Baek, Chang-Wook
- Issue Date
- May-2013
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- double-ended tuning fork (DETF) resonator; fused quartz; micromechanical resonator oscillator; quartz-on-quartz bonding
- Citation
- IEEE ELECTRON DEVICE LETTERS, v.34, no.5, pp 692 - 694
- Pages
- 3
- Journal Title
- IEEE ELECTRON DEVICE LETTERS
- Volume
- 34
- Number
- 5
- Start Page
- 692
- End Page
- 694
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/14673
- DOI
- 10.1109/LED.2013.2253753
- ISSN
- 0741-3106
1558-0563
- Abstract
- In this letter, a novel process to fabricate high-Q fused-quartz micromechanical resonators is demonstrated. Plasma-assisted quartz-on-quartz direct bonding at a low temperature in combination with quartz deep-reactive ion etching technique enables a simple wafer-level fabrication of self-mounted, electrostatically driven fused-quartz resonators. A 27-kHz capacitively transduced double-ended tuning fork fused-quartz resonator oscillator is successfully fabricated using the developed process. A high resonator Q-factor of 68 000 is obtained, and the constructed oscillator shows a signal-to-noise ratio of 70 dB.
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Collections - College of ICT Engineering > School of Electrical and Electronics Engineering > 1. Journal Articles
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