Hong K.; Min K.K.; Kim M.-H.; Bang S.; Kim T.-H.; Lee D.K.; Choi Y.J.; Kim C.S.; Lee J.Y.; Kim S., et al.
ArticleIssue Date2020CitationIEEE Transactions on Electron Devices, v.67, no.4, pp.1600 - 1605PublisherInstitute of Electrical and Electronics Engineers Inc.