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Miura, S.; Hsia, T.; Hung, J.; Jung, H. A.; Shih, J.; Park, C.; Lee, S. H.; Okamoto, T.; Ahn, H. K.; Lee, Y. C., et al.
Tamai, H.; Kaneko, Y.; Kameda, H.; Kuwana, M.; Okano, Y.; Ishii, T.; Ikeda, K.; Taguchi, H.; Sato, S.; Miyamoto, T., et al.
Miura, S.; Hsia, T-C.; Hung, J-Y.; Jung, H. A.; Shih, J-Y.; Park, C-K.; Lee, S. H.; Okamoto, T.; Ahn, H. K.; Lee, Y. C., et al.
Tamai, H.; Ikeda, K.; Miyamoto, T.; Taguchi, H.; Kuo, C. F.; Shin, K.; Hirata, S.; Okano, Y.; Sato, S.; Yasuoka, H., et al.
Miura, S.; Hsia, T-C.; Hung, J-Y.; Jung, H. A.; Shih, J-Y.; Yang, T-Y.; Park, C-K.; Lee, S. H.; Okamoto, T.; Ahn, H. K., et al.
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