A New No-Reference Method for Judder Artifact Assessment
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Oh, Se Ri | - |
dc.contributor.author | Jeong, Seyoon | - |
dc.contributor.author | Heo, Pyeonggang | - |
dc.contributor.author | Kim, Dongchan | - |
dc.contributor.author | Kim, Hui Yong | - |
dc.contributor.author | Park, HyunWook | - |
dc.date.available | 2020-02-27T02:40:39Z | - |
dc.date.created | 2020-02-04 | - |
dc.date.issued | 2019-10 | - |
dc.identifier.issn | 1051-8215 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/1137 | - |
dc.description.abstract | This paper proposes a new metric to measure judder artifacts of video sequences. The judder artifacts appear as non-smooth motions in hold-type displays when the frame rate is low and object motion is fast. To analyze the judder artifacts in video sequences, the proposed judder metric is defined by analyzing the effects and cross-relations of judder features in the video sequences. The judder features include spatial features of image gradients and temporal features of motion vectors and the frame rate. In addition, sensitivity of the human visual system (HVS) is considered to determine the perceptual judder artifacts because it has special characteristics of sensitivity to image brightness and contrast. Therefore, a sensitivity map of the HVS is used to mask the judder artifacts. Then, the degree of perceptual judder artifacts is estimated using the judder features and a regression model. The experimental results demonstrate that the proposed judder metric is highly correlated with the subjective assessment results. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY | - |
dc.subject | QUALITY | - |
dc.subject | MODEL | - |
dc.title | A New No-Reference Method for Judder Artifact Assessment | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000489749900003 | - |
dc.identifier.doi | 10.1109/TCSVT.2018.2875157 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, v.29, no.10, pp.2888 - 2898 | - |
dc.identifier.scopusid | 2-s2.0-85054701874 | - |
dc.citation.endPage | 2898 | - |
dc.citation.startPage | 2888 | - |
dc.citation.title | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY | - |
dc.citation.volume | 29 | - |
dc.citation.number | 10 | - |
dc.contributor.affiliatedAuthor | Kim, Dongchan | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | High frame rate | - |
dc.subject.keywordAuthor | judder artifacts | - |
dc.subject.keywordAuthor | judder assessment | - |
dc.subject.keywordAuthor | subjective assessment | - |
dc.subject.keywordPlus | QUALITY | - |
dc.subject.keywordPlus | MODEL | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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