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Working Pressure Dependence of WO3-x Thin Films Prepared by Reactive Facing Targets Sputtering

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dc.contributor.authorKim, Min Hong-
dc.contributor.authorBark, Chung Wung-
dc.contributor.authorChoi, Hyung Wook-
dc.contributor.authorKim, Kyung Hwan-
dc.date.available2020-02-28T15:46:19Z-
dc.date.created2020-02-06-
dc.date.issued2014-10-13-
dc.identifier.issn1542-1406-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/12203-
dc.description.abstractTungsten oxide (WO3-x) thin films for an electrochromic (EC) device were deposited at an oxygen flow ratio [O-2/(Ar + O-2)] of 0.7 using reactive facing-target sputtering with a variable working pressure. The correlation between the WO3-x thin films and EC properties was investigated. The films structural properties were measured by X-ray diffraction; the indium tin oxide diffraction peak was observed in all the films. The electrochemical and optical properties were measured by cyclic voltammetry and UV/Vis spectrometry. The WO3-x thin film obtained at 0.13 Pa displayed a maximum coloration efficiency of 31.42cm(2)/C, which indicated superior EC properties.-
dc.language영어-
dc.language.isoen-
dc.publisherTAYLOR & FRANCIS LTD-
dc.relation.isPartOfMOLECULAR CRYSTALS AND LIQUID CRYSTALS-
dc.subjectTUNGSTEN-OXIDE FILMS-
dc.subjectELECTROCHROMIC PROPERTIES-
dc.subjectCOATINGS-
dc.subjectDEVICES-
dc.subjectOXYGEN-
dc.titleWorking Pressure Dependence of WO3-x Thin Films Prepared by Reactive Facing Targets Sputtering-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000345832700023-
dc.identifier.doi10.1080/15421406.2014.944761-
dc.identifier.bibliographicCitationMOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.602, no.1, pp.185 - 192-
dc.identifier.scopusid2-s2.0-84945200473-
dc.citation.endPage192-
dc.citation.startPage185-
dc.citation.titleMOLECULAR CRYSTALS AND LIQUID CRYSTALS-
dc.citation.volume602-
dc.citation.number1-
dc.contributor.affiliatedAuthorKim, Min Hong-
dc.contributor.affiliatedAuthorBark, Chung Wung-
dc.contributor.affiliatedAuthorChoi, Hyung Wook-
dc.contributor.affiliatedAuthorKim, Kyung Hwan-
dc.type.docTypeArticle-
dc.subject.keywordAuthoroxygen flow ratio-
dc.subject.keywordAuthorreactive sputtering-
dc.subject.keywordAuthorfacing-target sputtering-
dc.subject.keywordAuthorTungsten oxide-
dc.subject.keywordAuthorelectrochromic-
dc.subject.keywordAuthorworking pressure-
dc.subject.keywordPlusTUNGSTEN-OXIDE FILMS-
dc.subject.keywordPlusELECTROCHROMIC PROPERTIES-
dc.subject.keywordPlusCOATINGS-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusOXYGEN-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaCrystallography-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryCrystallography-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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