In-situ X-ray microdiffraction analysis of local strain-field across the interface in a Pb(Zr0.52Ti0.48)O-3/Ni0.8Zn0.2Fe2O4/Pb(Zr0.52Ti0.48)O-3 tri-layered structure

Abstract

We have performed a synchrotron X-ray microdiffraction to investigate the variation of the local strain-field across the interface in Pb(Zr0.52Ti0.48)O-3/Ni0.8Zn0.2Fe2O4/Pb(Zr0.52Ti0.48)O-3 (PZT-NZFO-PZT) tri-layered structure. In this study, we show that the in-plane lattice parameters of the NZFO lattice depend strongly on the piezoelectric strain of the PZT layer. This result explains that an electric-field-induced piezoelectric strain from the PZT layer is effectively transferred to the NZFO layer. Furthermore, the local strain persists within 20 mu m away from the interface, inducing changes of magnetic responses via the inverse magnetostrictive effect. (C) 2014 Elsevier B.V. All rights reserved.