Investigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry
DC Field | Value | Language |
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dc.contributor.author | Park, Young Ran | - |
dc.contributor.author | Kim, Woo-Jae | - |
dc.contributor.author | Ko, Min Jae | - |
dc.contributor.author | Min, Nam Ki | - |
dc.contributor.author | Lee, Cheol Jin | - |
dc.date.available | 2020-02-29T09:46:10Z | - |
dc.date.created | 2020-02-05 | - |
dc.date.issued | 2012 | - |
dc.identifier.issn | 2040-3364 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/17529 | - |
dc.description.abstract | The ultraviolet optical properties of semiconducting-enriched and metallic-enriched single-walled carbon nanotube (semi-enriched and m-enriched SWCNT) networks were studied using spectroscopic ellipsometry. According to calculated energy loss function, the energy loss peak assigned to the maximum intensity of p-plasmon energy was found to increase from 4.5 eV to 5.0 eV as SWCNT network composition was changed from m-SWCNT enriched to semi-SWCNT enriched. These results clearly demonstrate that the dielectric response in the 4-6 eV range is sensitive to changes in the surrounding dielectric environment depending on the semi-/m-SWCNT content. Therefore, the spectral shift of this energy loss is attributed to the enhanced electron confinement by the presence of the surface plasmon due to a small amount of m-SWCNT, which is an important phenomenon at the SWCNT network. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ROYAL SOC CHEMISTRY | - |
dc.relation.isPartOf | NANOSCALE | - |
dc.subject | ELECTRONIC-STRUCTURE | - |
dc.subject | SEPARATION | - |
dc.title | Investigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000310976800053 | - |
dc.identifier.doi | 10.1039/c2nr31205k | - |
dc.identifier.bibliographicCitation | NANOSCALE, v.4, no.20, pp.6532 - 6536 | - |
dc.identifier.scopusid | 2-s2.0-84866974487 | - |
dc.citation.endPage | 6536 | - |
dc.citation.startPage | 6532 | - |
dc.citation.title | NANOSCALE | - |
dc.citation.volume | 4 | - |
dc.citation.number | 20 | - |
dc.contributor.affiliatedAuthor | Kim, Woo-Jae | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | ELECTRONIC-STRUCTURE | - |
dc.subject.keywordPlus | SEPARATION | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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