Radial heterostructure and interface effects on thermoelectric transport properties of Bi/Sn and Bi/Sb core/shell nanowires
DC Field | Value | Language |
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dc.contributor.author | Moon, Hongjae | - |
dc.contributor.author | Kim, Jeongmin | - |
dc.contributor.author | Chun, Dong Won | - |
dc.contributor.author | Hong, Seokkyoon | - |
dc.contributor.author | Yoon, Young Soo | - |
dc.contributor.author | Lee, Wooyoung | - |
dc.date.available | 2020-03-03T06:43:10Z | - |
dc.date.created | 2020-02-24 | - |
dc.date.issued | 2020-01 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/17647 | - |
dc.description.abstract | The thermoelectric transport properties of Bi/Sn and Bi/Sb core/shell (C/S) nanowires grown by the method of on-film formation of nanowires were systematically investigated. The electrical conductivity and Seebeck coefficient of nanowires with different diameters were measured as a function of the temperature. The contribution of Sn and Sb shells to the total transport in the C/S nanowires was determined using analytical fitting based on the parallel combination of the conducive system model. The carrier-interface boundary scattering at the C/S interface was quantitatively evaluated as the sheet resistance. In addition, the effect of hole doping on the transport properties was also observed in the Bi/Sn C/S nanowires. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.relation.isPartOf | CURRENT APPLIED PHYSICS | - |
dc.subject | FIGURE-OF-MERITS | - |
dc.subject | THERMAL-CONDUCTIVITY | - |
dc.subject | ELECTRICAL-RESISTIVITY | - |
dc.subject | POWER FACTOR | - |
dc.subject | SILICON | - |
dc.subject | BISMUTH | - |
dc.subject | REDUCTION | - |
dc.subject | STRAIN | - |
dc.title | Radial heterostructure and interface effects on thermoelectric transport properties of Bi/Sn and Bi/Sb core/shell nanowires | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000496996300008 | - |
dc.identifier.doi | 10.1016/j.cap.2019.10.007 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.20, no.1, pp.43 - 48 | - |
dc.identifier.scopusid | 2-s2.0-85073026172 | - |
dc.citation.endPage | 48 | - |
dc.citation.startPage | 43 | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 20 | - |
dc.citation.number | 1 | - |
dc.contributor.affiliatedAuthor | Yoon, Young Soo | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Core/shell nanowires | - |
dc.subject.keywordAuthor | On-film formation of nanowires | - |
dc.subject.keywordAuthor | Heterostructure | - |
dc.subject.keywordAuthor | Interface | - |
dc.subject.keywordAuthor | Thermoelectric | - |
dc.subject.keywordAuthor | Seebeck coefficient | - |
dc.subject.keywordPlus | FIGURE-OF-MERITS | - |
dc.subject.keywordPlus | THERMAL-CONDUCTIVITY | - |
dc.subject.keywordPlus | ELECTRICAL-RESISTIVITY | - |
dc.subject.keywordPlus | POWER FACTOR | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | BISMUTH | - |
dc.subject.keywordPlus | REDUCTION | - |
dc.subject.keywordPlus | STRAIN | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
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