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Cited 9 time in webofscience Cited 10 time in scopus
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Advanced cover glass defect detection and classification based on multi-DNN model

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dc.contributor.authorPark, Jisu-
dc.contributor.authorRiaz, Hamza-
dc.contributor.authorKim, Hyunchul-
dc.contributor.authorKim, Jungsuk-
dc.date.available2020-03-03T06:44:54Z-
dc.date.created2020-02-24-
dc.date.issued2020-01-
dc.identifier.issn2213-8463-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/17722-
dc.description.abstractDemands for display panels and relevant technologies are rapidly increasing with the recent advances in smart mobile devices. Many manufacturers have begun slowly investing in fully automated inspection systems that enable consistent and objective inspections. Carrying out such undertaking aims to satisfy high user requirements concerning quality while coping with high volumes. Cover glass is one of the important items for inspection because users directly interact with it. Despite the extensive use of typical machine vision-based solutions in this field, many manufacturers continue relying on human-based judgment because of a deficient understanding of defects or poor confidence in algorithms. To overcome these problems, this study proposes a deep-learning neural network (DLNN)-based defect inspection system. The DLNN has advantages over traditional computer vision- or human-based inspection in terms of flexibility and performance. We introduce a weighted multi-DLNN inspection system capable of efficiently utilizing multi-channel measurement data, with a detection rate of up to 99% and a false pass rate below 1%. © 2019 Society of Manufacturing Engineers (SME)-
dc.language영어-
dc.language.isoen-
dc.language.isoen-
dc.publisherELSEVIER-
dc.relation.isPartOfManufacturing Letters-
dc.titleAdvanced cover glass defect detection and classification based on multi-DNN model-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000645119300012-
dc.identifier.doi10.1016/j.mfglet.2019.12.006-
dc.identifier.bibliographicCitationManufacturing Letters, v.23, pp.53 - 61-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85077496226-
dc.citation.endPage61-
dc.citation.startPage53-
dc.citation.titleManufacturing Letters-
dc.citation.volume23-
dc.contributor.affiliatedAuthorPark, Jisu-
dc.contributor.affiliatedAuthorRiaz, Hamza-
dc.contributor.affiliatedAuthorKim, Jungsuk-
dc.type.docTypeArticle-
dc.subject.keywordAuthorDeep learning-
dc.subject.keywordAuthorDefect detection-
dc.subject.keywordAuthorSmart factory display manufacturing-
dc.subject.keywordPlusComputer vision-
dc.subject.keywordPlusDeep learning-
dc.subject.keywordPlusDeep neural networks-
dc.subject.keywordPlusDisplay devices-
dc.subject.keywordPlusGlass-
dc.subject.keywordPlusInspection-
dc.subject.keywordPlusInspection equipment-
dc.subject.keywordPlusDefect detection-
dc.subject.keywordPlusDefect inspection system-
dc.subject.keywordPlusDetection rates-
dc.subject.keywordPlusInspection system-
dc.subject.keywordPlusLearning neural networks-
dc.subject.keywordPlusMultichannel measurement-
dc.subject.keywordPlusTraditional computers-
dc.subject.keywordPlusUser requirements-
dc.subject.keywordPlusDefects-
dc.description.journalRegisteredClassscopus-
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