Improvement of UV photodetector properties of reactively sputtered TiO2-x films through vacuum annealing
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Reddy, Y. Ashok Kumar | - |
dc.contributor.author | Ajitha, B. | - |
dc.contributor.author | Reddeppa, Maddaka | - |
dc.contributor.author | Sreedhar, Adem | - |
dc.date.available | 2020-03-03T06:47:55Z | - |
dc.date.created | 2020-02-24 | - |
dc.date.issued | 2019-12 | - |
dc.identifier.issn | 0957-4522 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/17839 | - |
dc.description.abstract | We present the influence of vacuum annealing on RF magnetron-sputtered TiO2-x thin films grown at various oxygen partial pressures (pO2) of 2.0%, 4.0% and 6.0% to enhance the ultra-violet (UV) photodetector performance. Apart from the film deposited at 2.0% of pO2, all the as-grown TiO2-x films show an amorphous nature, whereas thermally annealed TiO2-x films at 400 degrees C show the rutile phase. As revealed by the linear current-voltage characteristics, the ohmic-contact behavior was observed between the TiO2-x layer and the electrode material. Benefiting from the above features, the photocurrent was significantly increased at 4.0% of pO2 due to the increase of oxygen vacancies and the suppression of electron-hole recombination. As a result, thermally annealed TiO2-x films are very useful for next-generation UV-photodetectors even at a lower power density of 1.72 mW/cm(2). Therefore, the merits of the above findings present a promising strategy to enhance the UV photoresponse of thermally annealed TiO2-x films by optimizing the pO2 at 4.0%. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | SPRINGER | - |
dc.relation.isPartOf | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | - |
dc.title | Improvement of UV photodetector properties of reactively sputtered TiO2-x films through vacuum annealing | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000495215800008 | - |
dc.identifier.doi | 10.1007/s10854-019-02434-2 | - |
dc.identifier.bibliographicCitation | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.30, no.23, pp.20687 - 20695 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-85074815307 | - |
dc.citation.endPage | 20695 | - |
dc.citation.startPage | 20687 | - |
dc.citation.title | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | - |
dc.citation.volume | 30 | - |
dc.citation.number | 23 | - |
dc.contributor.affiliatedAuthor | Sreedhar, Adem | - |
dc.type.docType | Article; Early Access | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordPlus | RESPONSIVITY | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | FABRICATION | - |
dc.subject.keywordPlus | NANOFIBERS | - |
dc.subject.keywordPlus | RUTILE | - |
dc.subject.keywordPlus | RATIO | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
1342, Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do, Republic of Korea(13120)031-750-5114
COPYRIGHT 2020 Gachon University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.