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RF 스퍼터 공정압력의 변화에 따른 TiO2 박막의 특성

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dc.contributor.author최형욱-
dc.date.available2020-04-24T15:45:43Z-
dc.date.issued2009-06-20-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/33586-
dc.titleRF 스퍼터 공정압력의 변화에 따른 TiO2 박막의 특성-
dc.title.alternativeThe Characteristics of TiO2 thin films on Working pressure of RF Sputter-
dc.typeConference-
dc.citation.conferenceName2009년도 한국전기전자재료학회 하계학술대회-
dc.citation.conferencePlace대한민국-
dc.citation.conferencePlace창원켄벤션센터-
dc.citation.endPage219-
dc.citation.startPage218-
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