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Cited 4 time in webofscience Cited 4 time in scopus
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X-ray image denoising with fast non-local means (FNLM) approach using acceleration function in CdTe semiconductor photon counting detector (PCD): Monte Carlo simulation study

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dc.contributor.authorLee, Youngjin-
dc.date.available2020-02-27T15:43:33Z-
dc.date.created2020-02-06-
dc.date.issued2018-
dc.identifier.issn0030-4026-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/5266-
dc.description.abstractThe noise reduction algorithms have been widely used in the field of medical X-ray imaging system using semiconductor photon counting detector (PCD). Among these algorithms, fast non-local means (FNLM) method is based on use of the encoded information and considering the local region in the image. The aim of this study was to design FNLM noise reduction algorithm using acceleration function with Euclidean distance, which is feasible to cope with practical problems, and to confirm its application feasibility in CdTe PCD. We simulated X-ray imaging system with PCD using Monte Carlo simulation tool (Geant4 Application for Tomographic Emission (GATE)) version 6 and applied conventional and proposed noise reduction algorithms in acquired water phantom image. We conclude that the results of the image performances associated with noise characteristics demonstrated the superiority of the proposed FNLM noise reduction algorithm in CdTe PCD imaging system.-
dc.language영어-
dc.language.isoen-
dc.publisherELSEVIER GMBH, URBAN & FISCHER VERLAG-
dc.relation.isPartOfOPTIK-
dc.subjectPARALLEL-HOLE COLLIMATOR-
dc.subjectCOMPUTED-TOMOGRAPHY-
dc.subjectSYSTEM-
dc.subjectCAMERA-
dc.subjectNOISE-
dc.subjectFEASIBILITY-
dc.subjectPERFORMANCE-
dc.subjectSPECT-
dc.titleX-ray image denoising with fast non-local means (FNLM) approach using acceleration function in CdTe semiconductor photon counting detector (PCD): Monte Carlo simulation study-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000445714700057-
dc.identifier.doi10.1016/j.ijleo.2018.07.051-
dc.identifier.bibliographicCitationOPTIK, v.172, pp.456 - 461-
dc.identifier.scopusid2-s2.0-85050121964-
dc.citation.endPage461-
dc.citation.startPage456-
dc.citation.titleOPTIK-
dc.citation.volume172-
dc.contributor.affiliatedAuthorLee, Youngjin-
dc.type.docTypeArticle-
dc.subject.keywordAuthorX-ray denoising-
dc.subject.keywordAuthorNon-local means algorithm using acceleration function-
dc.subject.keywordAuthorCdTe photon counting detector-
dc.subject.keywordAuthorQuantitative evaluation of image performance-
dc.subject.keywordAuthorMonte Carlo simulation-
dc.subject.keywordPlusPARALLEL-HOLE COLLIMATOR-
dc.subject.keywordPlusCOMPUTED-TOMOGRAPHY-
dc.subject.keywordPlusSYSTEM-
dc.subject.keywordPlusCAMERA-
dc.subject.keywordPlusNOISE-
dc.subject.keywordPlusFEASIBILITY-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusSPECT-
dc.relation.journalResearchAreaOptics-
dc.relation.journalWebOfScienceCategoryOptics-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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