Surface Reactions of Atomic Hydrogen with Ge(100) in Comparison with Si(100)
DC Field | Value | Language |
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dc.contributor.author | Jo, Sam Keun | - |
dc.date.available | 2020-02-27T16:43:56Z | - |
dc.date.created | 2020-02-06 | - |
dc.date.issued | 2017-11 | - |
dc.identifier.issn | 2288-6559 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/5571 | - |
dc.description.abstract | The reactions of thermal hydrogen atoms H(g) with the Ge(100) surface were examined with temperature-programmed desorption (TPD) mass spectrometry. Concomitant H-2 and CH4 TPD spectra taken from the H(g)-irradiated Ge(100) surface were distinctly different for low and high H(g) doses/substrate temperatures. Reactions suggested by our data are: (1) adsorbed mono(beta(1))-/di-hydride(beta(2))-H(g) formation; (2) H(a)-by-H(g) abstraction; (3) GeH3(a)-by-H(g) abstraction (Ge etching); and (4) hydrogenated amorphous germanium a-Ge:H formation. While all these reactions occur, albeit at higher temperatures, also on Si(100), H(g) absorption by Ge(100) was not detected. This is in contrast to Si(100) which absorbed H(g) readily once the surface roughened on the atomic scale. While this result is rather against expectation from its weaker and longer Ge-Ge bond as well as a larger lattice constant, we attribute the absence of direct H(g) absorption to insufficient atomic-scale surface roughening and to highly efficient subsurface hydrogenation at moderate (>300 K) and low (<= 300 K) temperatures, respectively. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | KOREAN VACUUM SOC | - |
dc.relation.isPartOf | APPLIED SCIENCE AND CONVERGENCE TECHNOLOGY | - |
dc.subject | ABSORPTION | - |
dc.subject | SILICON | - |
dc.title | Surface Reactions of Atomic Hydrogen with Ge(100) in Comparison with Si(100) | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 2 | - |
dc.identifier.wosid | 000441479200004 | - |
dc.identifier.doi | 10.5757/ASCT.2017.26.6.174 | - |
dc.identifier.bibliographicCitation | APPLIED SCIENCE AND CONVERGENCE TECHNOLOGY, v.26, no.6, pp.174 - 178 | - |
dc.identifier.kciid | ART002289508 | - |
dc.citation.endPage | 178 | - |
dc.citation.startPage | 174 | - |
dc.citation.title | APPLIED SCIENCE AND CONVERGENCE TECHNOLOGY | - |
dc.citation.volume | 26 | - |
dc.citation.number | 6 | - |
dc.contributor.affiliatedAuthor | Jo, Sam Keun | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Ge(100) Surface Adsorption | - |
dc.subject.keywordAuthor | Surface Etching | - |
dc.subject.keywordAuthor | Hydrogen Adsorption | - |
dc.subject.keywordAuthor | Subsurface Hydrogenation | - |
dc.subject.keywordPlus | ABSORPTION | - |
dc.subject.keywordPlus | SILICON | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | kci | - |
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