Testing intermediate representations for binary analysis
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, S. | - |
dc.contributor.author | Faerevaag, M. | - |
dc.contributor.author | Jung, M. | - |
dc.contributor.author | Jung, S. | - |
dc.contributor.author | Oh, D. | - |
dc.contributor.author | Lee, J. | - |
dc.contributor.author | Cha, S.K. | - |
dc.date.available | 2020-02-27T20:42:52Z | - |
dc.date.created | 2020-02-12 | - |
dc.date.issued | 2017 | - |
dc.identifier.issn | 0000-0000 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/6693 | - |
dc.description.abstract | Binary lifting, which is to translate a binary executable to a high-level intermediate representation, is a primary step in binary analysis. Despite its importance, there are only few existing approaches to testing the correctness of binary lifters. Furthermore, the existing approaches suffer from low test coverage, because they largely depend on random test case generation. In this paper, we present the design and implementation of the first systematic approach to testing binary lifters. We have evaluated the proposed system on 3 state-of-the-art binary lifters, and found 24 previously unknown semantic bugs. Our result demonstrates that writing a precise binary lifter is extremely difficult even for those heavily tested projects. © 2017 IEEE. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.relation.isPartOf | ASE 2017 - Proceedings of the 32nd IEEE/ACM International Conference on Automated Software Engineering | - |
dc.subject | Program debugging | - |
dc.subject | Semantics | - |
dc.subject | Software engineering | - |
dc.subject | Binary analysis | - |
dc.subject | Design and implementations | - |
dc.subject | Intermediate representations | - |
dc.subject | Random tests | - |
dc.subject | State of the art | - |
dc.subject | Test coverage | - |
dc.subject | Bins | - |
dc.title | Testing intermediate representations for binary analysis | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.doi | 10.1109/ASE.2017.8115648 | - |
dc.identifier.bibliographicCitation | ASE 2017 - Proceedings of the 32nd IEEE/ACM International Conference on Automated Software Engineering, pp.353 - 364 | - |
dc.identifier.scopusid | 2-s2.0-85041439452 | - |
dc.citation.endPage | 364 | - |
dc.citation.startPage | 353 | - |
dc.citation.title | ASE 2017 - Proceedings of the 32nd IEEE/ACM International Conference on Automated Software Engineering | - |
dc.contributor.affiliatedAuthor | Lee, J. | - |
dc.type.docType | Conference Paper | - |
dc.subject.keywordPlus | Program debugging | - |
dc.subject.keywordPlus | Semantics | - |
dc.subject.keywordPlus | Software engineering | - |
dc.subject.keywordPlus | Binary analysis | - |
dc.subject.keywordPlus | Design and implementations | - |
dc.subject.keywordPlus | Intermediate representations | - |
dc.subject.keywordPlus | Random tests | - |
dc.subject.keywordPlus | State of the art | - |
dc.subject.keywordPlus | Test coverage | - |
dc.subject.keywordPlus | Bins | - |
dc.description.journalRegisteredClass | scopus | - |
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