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Cited 20 time in webofscience Cited 20 time in scopus
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Advances in Compact Modeling of Organic Field-Effect Transistors

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dc.contributor.authorJung, Sungyeop-
dc.contributor.authorBonnassieux, Yvan-
dc.contributor.authorHorowitz, Gilles-
dc.contributor.authorJung, Sungjune-
dc.contributor.authorIniguez, Benjamin-
dc.contributor.authorKim, Chang-Hyun-
dc.date.available2020-12-28T00:40:21Z-
dc.date.created2020-12-28-
dc.date.issued2020-08-
dc.identifier.issn2168-6734-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/79410-
dc.description.abstractIn this review, recent advances in compact modeling of organic field-effect transistors (OFETs) are presented. Despite the inherent strength for printed flexible electronics and the extremely aggressive research conducted over more than three decades, the OFET technology still seems to remain at a relatively low technological readiness level. Among various possible reasons for that, the lack of a standard compact model, which effectively bridges the device- and system-level development, is clearly one of the most critical issues. This article broadly discusses the essential requirements, up-to-date progresses, and imminent challenges for the OFET compact device modeling toward a universal, physically valid, and applicable description of this fast-developing technology.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY-
dc.titleAdvances in Compact Modeling of Organic Field-Effect Transistors-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000597142700008-
dc.identifier.doi10.1109/JEDS.2020.3020312-
dc.identifier.bibliographicCitationIEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.8, pp.1404 - 1415-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85094888912-
dc.citation.endPage1415-
dc.citation.startPage1404-
dc.citation.titleIEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY-
dc.citation.volume8-
dc.contributor.affiliatedAuthorKim, Chang-Hyun-
dc.type.docTypeArticle-
dc.subject.keywordAuthorOFETs-
dc.subject.keywordAuthorMathematical model-
dc.subject.keywordAuthorIntegrated circuit modeling-
dc.subject.keywordAuthorBiological system modeling-
dc.subject.keywordAuthorSemiconductor device modeling-
dc.subject.keywordAuthorNumerical models-
dc.subject.keywordAuthorOrganic field-effect transistors (OFETs)-
dc.subject.keywordAuthorcompact modeling-
dc.subject.keywordAuthordevice physics-
dc.subject.keywordAuthorcircuit simulation-
dc.subject.keywordAuthorflexible and printed electronics-
dc.subject.keywordPlusTHIN-FILM TRANSISTORS-
dc.subject.keywordPlusVOLTAGE-DEPENDENCE-
dc.subject.keywordPlusTHRESHOLD VOLTAGE-
dc.subject.keywordPlusCHARGE-
dc.subject.keywordPlusCAPACITANCE-
dc.subject.keywordPlusSEMICONDUCTORS-
dc.subject.keywordPlusMOBILITY-
dc.subject.keywordPlusDEVICE-
dc.subject.keywordPlusOTFTS-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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