Display-pixel performances driven by contact-limited switching transistors
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Seunghyuk | - |
dc.contributor.author | Kim, Chang-Hyun | - |
dc.date.accessioned | 2021-06-07T08:40:08Z | - |
dc.date.available | 2021-06-07T08:40:08Z | - |
dc.date.created | 2021-05-10 | - |
dc.date.issued | 2021-06 | - |
dc.identifier.issn | 0268-1242 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/81212 | - |
dc.description.abstract | In this paper, a direct link between contact properties of the transistor and electrical behaviors of the display system is established. Employing a liquid-crystal display driven by organic thin-film transistors as a model platform, systematic simulation of the image pixel circuit is performed to investigate this critical relationship. An elevated contact resistance at the transistor level is found to have a profound impact on charging dynamics of cell capacitors, revealing the importance of rendering such effects in designing advanced display electronics. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.relation.isPartOf | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | - |
dc.title | Display-pixel performances driven by contact-limited switching transistors | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000646873200001 | - |
dc.identifier.doi | 10.1088/1361-6641/abf62d | - |
dc.identifier.bibliographicCitation | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.36, no.6 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-85105115539 | - |
dc.citation.title | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 36 | - |
dc.citation.number | 6 | - |
dc.contributor.affiliatedAuthor | Lee, Seunghyuk | - |
dc.contributor.affiliatedAuthor | Kim, Chang-Hyun | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | organic thin-film transistors | - |
dc.subject.keywordAuthor | contact resistance | - |
dc.subject.keywordAuthor | display | - |
dc.subject.keywordAuthor | pixels | - |
dc.subject.keywordAuthor | circuit simulation | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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