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Applying Deep Learning Technologies to Evaluate the Patent Quality with the Collaborative Training

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dc.contributor.authorYou, X.-
dc.contributor.authorLiu, J.-
dc.contributor.authorWang, Z.-
dc.contributor.authorLiu, Z.-
dc.contributor.authorLv, X.-
dc.contributor.authorKim, Jung Yoon-
dc.date.accessioned2022-02-14T23:40:29Z-
dc.date.available2022-02-14T23:40:29Z-
dc.date.created2021-11-13-
dc.date.issued2021-10-
dc.identifier.issn1530-8669-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/83481-
dc.description.abstractAs the country vigorously promotes the development of science and technology and tries to enhance independent innovation capabilities, more and more attention is paid on the protection of technology ownership. In recent years, China has developed rapidly in many scientific and technological fields, and the number of patent applications increased year by year. However, various patent quality problems including immature patent technology and low patent authorization rate appear. The indicators of patent quantification and quality evaluation are studied in this paper. First, we quantify the patent quality evaluation indicators and combine the content of the patent text to build a patent evaluation model. US patents with patent grade labels are used for training with multitask learning technology. Second, the evaluation model is transferred from the English patents to the Chinese patents, in which the active learning technology and transfer learning technology are used to minimize the work of manual labeling. Finally, a Chinese patent quality evaluation model based on collaborative training was designed and implemented. Methods used in this experiment have notably improved the prediction effect of the model and achieved a better migration effect. A large number of experimental results show that the Chinese patent quality evaluation model has achieved good evaluation results. This research uses deep learning and natural language processing technology to carry out research on patent quality evaluation models from different perspectives, to provide patent decision support for related companies, and to point out research directions for research institutions and patent inventors. © 2021 Xindong You et al.-
dc.language영어-
dc.language.isoen-
dc.publisherWILEY-HINDAWI-
dc.relation.isPartOfWireless Communications and Mobile Computing-
dc.titleApplying Deep Learning Technologies to Evaluate the Patent Quality with the Collaborative Training-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000751917600005-
dc.identifier.doi10.1155/2021/5006974-
dc.identifier.bibliographicCitationWireless Communications and Mobile Computing, v.2021-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85118589832-
dc.citation.titleWireless Communications and Mobile Computing-
dc.citation.volume2021-
dc.contributor.affiliatedAuthorKim, Jung Yoon-
dc.type.docTypeArticle-
dc.subject.keywordPlusDecision support systems-
dc.subject.keywordPlusDeep learning-
dc.subject.keywordPlusEngineering education-
dc.subject.keywordPlusNatural language processing systems-
dc.subject.keywordPlusQuality control-
dc.subject.keywordPlusCollaborative training-
dc.subject.keywordPlusDevelopment of science and technologies-
dc.subject.keywordPlusEvaluation models-
dc.subject.keywordPlusIndependent innovation-
dc.subject.keywordPlusInnovation capability-
dc.subject.keywordPlusLearning technology-
dc.subject.keywordPlusPatent applications-
dc.subject.keywordPlusQuality evaluation-
dc.subject.keywordPlusQuality evaluation models-
dc.subject.keywordPlusQuality problems-
dc.subject.keywordPlusPatents and inventions-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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