Functional Design of Highly Robust and Flexible Thin-Film Encapsulation Composed of Quasi-Perfect Sublayers for Transparent, Flexible Displays
- Authors
- Kwon, Jeong Hyun; Jeon, Yongmin; Choi, Seungyeop; Park, Jeong Woo; Kim, Hyuncheol; Choi, Kyung Cheol
- Issue Date
- Dec-2017
- Publisher
- AMER CHEMICAL SOC
- Keywords
- bioinspiration; water vapor transmission rate (WVTR); nanolaminate structure; thin-film encapsulation; organic light-emitting diodes (OLEDs)
- Citation
- ACS APPLIED MATERIALS & INTERFACES, v.9, no.50, pp.43983 - 43992
- Journal Title
- ACS APPLIED MATERIALS & INTERFACES
- Volume
- 9
- Number
- 50
- Start Page
- 43983
- End Page
- 43992
- URI
- https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/84335
- DOI
- 10.1021/acsami.7b14040
- ISSN
- 1944-8244
- Abstract
- In this study, a structurally and materially designed thin-film encapsulation is proposed to guarantee the reliability of transparent, flexible displays by significantly improving their barrier properties, mechanical stability, and environmental reliability, all of which are essential for organic light-emitting diode (OLED) encapsulation. We fabricated a bioinspired, nacre-like ZnO/Al2O3/MO laminate structure (ZAM) using atomic layer deposition for the microcrack toughening effect. The ZAM film was formed with intentional voids and defects through the formation of-a quasi-perfect sublayer, rather than the simple fabrication of nanolaminate structures. The 240 nm thick ZAM-based multibarrier (ZAM-TFE) with a compressively strained organic layer demonstrated: an optical transmittance of 91.35% in the visible range, an extremely low water vapor transmission rate of 2.06 X 10(-6) g/m(2)/day, a mechanical stability enduring a strain close to 1%, and a residual stress close to 0, showing significant improvement of key TFE properties in comparison to an Al2O3-based multibarrier. In addition, ZAM-TFE demonstrated superior environmental resistance without degradation of barrier properties in a severe environment of 85 degrees C and 90% relative humidity (RH). Thus, our structurally and materially designed ZAM film has been well optimized in terms of its applicability as a gas diffusion barrier as well as in terms of its mechanical and environmental reliability. Finally, we confirmed the feasibility of the ZAM-TFE through application in OLEDs. The low-temperature ZAM-TFE technology showed great potential to provide a highly robust and flexible TFE of TFOLEDs.
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