Accurate parametrization revealing an extremely low disorder in polymer field-effect transistors
DC Field | Value | Language |
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dc.contributor.author | Romanjek, Krunoslav | - |
dc.contributor.author | Charbonneau, Micael | - |
dc.contributor.author | Kim, Chang-Hyun | - |
dc.date.accessioned | 2022-07-11T05:40:19Z | - |
dc.date.available | 2022-07-11T05:40:19Z | - |
dc.date.created | 2022-07-11 | - |
dc.date.issued | 2022-06 | - |
dc.identifier.issn | 2058-8585 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/84932 | - |
dc.description.abstract | In this paper, a robust self-consistent parameter extraction method is applied to high-performance p-type printed polymer field-effect transistors. Simultaneous extraction of contact resistance and intrinsic channel mobility with their full gate-voltage dependence is achieved through an analytically reinforced transmission-line method. The proposed method yields a minimum width-normalized contact resistance of 12 k omega cm and a maximum hole mobility of 1.9 cm(2) V-1 s(-1). Moreover, the gate-voltage-dependent mobility is interpreted in the framework of trap-and-release transport through double-exponential density of states, unveiling a disorder energy near the transport orbital as low as 29 meV. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP Publishing Ltd | - |
dc.relation.isPartOf | FLEXIBLE AND PRINTED ELECTRONICS | - |
dc.title | Accurate parametrization revealing an extremely low disorder in polymer field-effect transistors | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000804404800001 | - |
dc.identifier.doi | 10.1088/2058-8585/ac72dd | - |
dc.identifier.bibliographicCitation | FLEXIBLE AND PRINTED ELECTRONICS, v.7, no.2 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-85131693533 | - |
dc.citation.title | FLEXIBLE AND PRINTED ELECTRONICS | - |
dc.citation.volume | 7 | - |
dc.citation.number | 2 | - |
dc.contributor.affiliatedAuthor | Kim, Chang-Hyun | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | printed electronics | - |
dc.subject.keywordAuthor | organic field-effect transistors | - |
dc.subject.keywordAuthor | parameter extraction methods | - |
dc.subject.keywordAuthor | charge-carrier mobility | - |
dc.subject.keywordAuthor | contact resistance | - |
dc.subject.keywordPlus | MOBILITY | - |
dc.subject.keywordPlus | TRANSPORT | - |
dc.subject.keywordPlus | DENSITY | - |
dc.subject.keywordPlus | STATES | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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