van der waals interactions of graphene membranes with a sharp silicon tip
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Suk, Ji Won | - |
dc.contributor.author | Kim, TaeYoung | - |
dc.contributor.author | Piner, Richard D. | - |
dc.date.available | 2020-02-28T07:42:05Z | - |
dc.date.created | 2020-02-06 | - |
dc.date.issued | 2015-12 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/9874 | - |
dc.description.abstract | Adhesive interactions of suspended graphene membranes were studied by using non-contact atomic force microscopy (AFM) with a sharp silicon tip. Circular graphene membranes were prepared by transferring large-area monolayer graphene onto a perforated substrate. The non-contact AFM imaging showed a fluctuation of the graphene membrane. The maximum deflection of a 2.7- mu m-diameter membrane was about 26.8 nm. The dynamic deflection of the membrane is attributed to the van der Waals interactions between the graphene membrane and the silicon tip of the AFM, and the interaction force was estimated to be about 3.0 nN. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.title | van der waals interactions of graphene membranes with a sharp silicon tip | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000365816300020 | - |
dc.identifier.doi | 10.3938/jkps.67.2003 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.67, no.11, pp.2003 - 2006 | - |
dc.identifier.kciid | ART002055995 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-84949033618 | - |
dc.citation.endPage | 2006 | - |
dc.citation.startPage | 2003 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 67 | - |
dc.citation.number | 11 | - |
dc.contributor.affiliatedAuthor | Kim, TaeYoung | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Graphene | - |
dc.subject.keywordAuthor | Membrane | - |
dc.subject.keywordAuthor | Deflection | - |
dc.subject.keywordAuthor | Atomic force microscopy | - |
dc.subject.keywordAuthor | Adhesion | - |
dc.subject.keywordPlus | MONOLAYER GRAPHENE | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | TRANSPARENT | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
1342, Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do, Republic of Korea(13120)031-750-5114
COPYRIGHT 2020 Gachon University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.