ScholarWorks@Gachon: Yoon, Uei Joong

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Yoon, Uei Joong (윤의중)

College of IT Convergence (의공학과)

Research Area: 마이크로파 및 광전자

Tel 032-820-4252
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TE scattering:13||PMM:12||FGMM.:11||Conductive boundary condition:8||TM scattering:8||double dielectric layer:5||LSTM:4||GRU:4||grounded double dielectric layer.:4||FGMM:4||Chebyshev polynomials of the first kind:3||2중 유전체층:3||Resistive boundary condition:3||double dielectric layer.:3||Resistive Boundary Condition:2||Deep learning:2||conductive boundary condition:2||Edge boundary condition:2||edge boundary condition:2||Chebyshev polynomials of the second kind:2||point matching method:2||TM 산란:2||Double Dielectric Layer:2||딥러닝:2||심전도:2||저항경계조건:2||resistive strip:1||resistivity:1||strip spacing:1||strip width.:1||two dielectric layers:1||디지털 FIR 저역 통과 필터:1||디지털 IIR 저역통과 필터:1||접지된 2중 유전체층:1||해밍 윈도우:1||Conducting strip:1||Digital FIR lowpass filter:1||Digital IIR lowpass filter:1||Epolarized electromagnetic scattering:1||ECG:1||Electrocardiogram:1||Fourier Galerkin moment method:1||FourierGalerkin Moment Method:1||Grounded Double dielectric layer:1||Hpolarized electromagnetic scattering:1||Hamming window:1||Point matching and Fourier galerkin moment method:1||Point matching method:1||TE:1||TE Scattering:1||TE scattering.:1||TE 산란:1||TM:1||Two dielectric layers:1||conductive strip:1||condutive boundary condition:1||exponential function:1||fourier galerkin moment method:1||relative permittivity:1||resistive boundary condition:1||

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1342, Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do, Republic of Korea(13120)031-750-5114

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