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Nanoscale CuO solid-electrolyte-based conductive-bridging, random-access memory cell with a TiN linerGo to Link

Lee, Jong-Sun; Kim, Dong-Won; Kim, Hea-Jee; Jin, Soo-Min; Song, Myung-Jin; Kwon, Ki-Hyun; Park, Jea-Gun; Jalalah, Mohammed; Al-Hajry, Ali

ArticleIssue Date2018CitationJournal of the Korean Physical Society, v.72, no.1, pp 116 - 121Publisher한국물리학회
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