Aulchenko, VM; Zhilich, VN; Zhulanov, VV; Kuzmin, AS; Matvienko, DV; Mibayashi, K; Nakamura, I; Usov, YuV; Cheon, Byung Gu; Shwartz, BA, et al.
ArticleIssue Date2015CitationOptoelectronics, Instrumentation and Data Processing (English translation of Avtometriya), v.51, no.1, pp 31 - 38PublisherAllerton Press Inc.