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Effect of oxygen stoichiometry on the threshold switching of RF-sputtered NbOx (x=2.0-2.5) filmsGo to Link

Aziz, Jamal; Kim, Honggyun; Rehman, Shania; Hur, Ji-Hyun; Song, Yun-Heub; Khan, Muhammad Farooq; Kim, Deok-kee

ArticleIssue Date2021CitationMaterials Research Bulletin, v.144, pp 1 - 9PublisherPergamon Press Ltd.
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