Seok, Moo-Young; Lee, Dong-Hyun; Lee, Jung-A; Kim, Yong-Jae; Lee, Yun-Hee; Baek, Un Bong; Nahm, Seung Hoon; Jang, Jae il
ArticleIssue Date2012Citation20th IMEKO World Congress 2012, v.3, pp.1731 - 1732PublisherInternational Measurement Confederation (IMEKO)