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Enhancing a Lock-and-key Scheme with MTE to Mitigate Use-After-FreesGo to Linkopen access

Bang, Inyoung; Kayondo, Martin; You, Junseung; Kwon, Donghyun; Cho, Yeongpil; Paek, Yunheung

ArticleIssue Date2024CitationIEEE Access, v.12, pp 5462 - 5476PublisherInstitute of Electrical and Electronics Engineers Inc.
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