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A Novel Structure for Beyond-45 nm NOR Flash Technology Featuring Short Channel Effect Immunity and Low Random Telegraph Signal NoiseGo to Link

Kwon, Wook Hyun; Song, Yun Heub; Cai, Yimao; Shim, Sang Pil

ArticleIssue Date2008CitationJapanese Journal of Applied Physics, v.47, no.12, pp 8802 - 8804PublisherIOP Publishing Ltd
SCIESCOPUS
The impact of random telegraph signals on the threshold voltage variation of 65 nm multilevel NOR flash memoryGo to Link

Cai, Yimao; Song, Yun Heub; Kwon, Wook-Hyun; Lee, Bong Yong; Park, Chan-Kwang

ArticleIssue Date2008CitationJapanese Journal of Applied Physics, v.47, no.4, pp 2733 - 2735PublisherIOP Publishing Ltd
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