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Investigation of Vertical Channel Architecture for Bulk Erase Operation in Three-Dimensional NAND Flash MemoryGo to Link

Lee, Gae-Hun; Kim, Kyeong-Rok; Yang, Hyung Jun; Park, Sung-Kye; Cho, Gyu-Seog; Choi, Eun-Seok; Song, Yun-Heub

ArticleIssue Date2012CitationJapanese Journal of Applied Physics, v.51, no.11PublisherIOP Publishing Ltd
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