In, Hai-Jung; Oh, Kyong-Hwan; Lee, Inhwan; Ryu, Do-Hyung; Choi, Sang-Moo; Kim, Keum-Nam; Kim, Hye-Dong; Kwon, Oh-Kyong
ArticleIssue Date2010CitationIEEE Transactions on Electron Devices, v.57, no.11, pp 3012 - 3019PublisherInstitute of Electrical and Electronics Engineers