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Correlation between the atomic structures and the misorientation angles of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substratesGo to Link

Shin, Jin-Wook; Lee, Jeong Yong; No, Young-Soo; Kim, Tate Whan; Choi, Wee Kiong

ArticleIssue Date2006CitationApplied Physics Letters, v.89, no.10PublisherAmerican Institute of Physics
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