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Edge roughness analysis in nanoscale for single-molecule localization microscopy imagesGo to Linkopen access

Jeong, Uidon; Go, Ga-Eun; Jeong, Dokyung; Lee, Dongmin; Kim, Min Jeong; Kang, Minjae; Kim, Namyoon; Jung, Jaehwang; Kim, Wookrae; Lee, Myungjun, et al.

ArticleIssue Date2024CitationNanophotonics, v.13, no.2, pp 195 - 207PublisherWALTER DE GRUYTER GMBH
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