Basaglia, T.; Bonanomi, M.; Cattorini, F.; Han, M.C.; Hoff, G.; Kim, Chan Hyeong; Kim, S.H.; Marcoli, M.; Pia, M.G.; Ronchieri, E., et al.
ArticleIssue Date2016Citation2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, pp.1 - 3PublisherInstitute of Electrical and Electronics Engineers Inc.