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Characterization of deep levels in a-plane GaN epi-layers grown using various growth techniquesGo to Link

Song, Hooyoung; Kim, Eun Kyu; Baik, Kwang Hyeon; Hwang, Sung-Min; Jang, Yong Woon; Lee, Jeong Yong

ArticleIssue Date2012CitationJournal of Crystal Growth, v.340, no.1, pp 23 - 27PublisherElsevier BV
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Microstructural characterization at the interface of Al2O3/ZnO/Al2O3 thin films grown by atomic layer depositionGo to Link

Jang, Yong Woon; Bang, Seokhwan; Jeon, Hyeongtag; Lee, Jeong Yong

ArticleIssue Date2011CitationPhysica Status Solidi (B): Basic Research, v.248, no.7, pp 1634 - 1638PublisherJohn Wiley & Sons Ltd.
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Role of postannealing temperature on the microstructure of Al2O3/ZnO thin films grown by atomic layer deposition for TFT applicationsGo to Link

Jang, Yong Woon; Bang, Seokhwan; Jeon, Hyeongtag; Lee, Jeong Yong

ArticleIssue Date2010Citationphysica status solidi (a) - applications and materials science, v.207, no.9, pp 2185 - 2189PublisherWiley - V C H Verlag GmbbH & Co.
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