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A compact model for SiGe heterojunction bipolar transistor under AC-stress conditionsGo to Linkopen access

Kim, Taeyeong; Kang, Kyubeom; Lee, Jongho; Jeong, Junhwa; Oakley, Michael A.; Cho, Moon-Kyu; Cressler, John D.; Lee, Byunghun; Song, Ickhyun

ArticleIssue Date2026CitationResults in Physics, v.85, pp 1 - 9PublisherElsevier B.V.
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Application of Device-Degradation Modeling to SiGe-LNA AnalysisGo to Link

Kim, Taeyeong; Lee, Jongho; Jeong, Junhwa; Oakley, Michael A.; Cressler, John D.; Song, Ickhyun

ArticleIssue Date2025Citation2025 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), pp 46 - 49PublisherInstitute of Electrical and Electronics Engineers Inc.
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Impact of MOSFET source/drain resistance on channel thermal noise calculation and noise performanceGo to Linkopen access

Jeong, Junhwa; Myeong, Ilho; Song, Ickhyun

ArticleIssue Date2026CitationResults in Physics, v.84, pp 1 - 9PublisherElsevier B.V.
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