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Stabilized negative capacitance for near-theoretical efficiency and high reliability in charge trap flash memoryGo to Link

Lee, Sangho; Kim, Giuk; Nam, Yunseok; Jeong, Yangjin; Kang, Hyunjun; Kim, Woongjin; Shin, Hunbeom; Shin, Mincheol; Park, Sanghyun; Seo, Kwangyou, et al.

ArticleIssue Date2025CitationMaterials Today Physics, v.58, pp 1 - 10PublisherELSEVIER SCIENCE BV
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