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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Chip-Level Defect Analysis with Virtual Bad Wafers Based on Huge Big Data Handling for Semiconductor ProductionGo to Linkopen access

Kim, Jinsik; Joe, Inwhee

ArticleIssue Date2024CitationElectronics (Basel), v.13, no.11, pp 1 - 17PublisherMDPI AG
SCOPUS
Wafer-Level Root Cause Detection with Association Rule Mining Based on Recalculated Metrics and Interaction EffectsGo to Link

Kim, Jinsik; Joe, Inwhee

ArticleIssue Date2025CitationLecture Notes in Networks and Systems, v.1492, pp 67 - 81PublisherSpringer International Publishing AG
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