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Temperature Dependence According to Grain Boundary Potential Barrier Variation in Vertical NAND Flash Cell with Polycrystalline-Silicon ChannelGo to Link

Yang, Hyung Jun; Oh, Young Taek; Kim, Kyu Beom; Kweon, Jun Young; Lee, Gae Hun; Choi, Eun Seok; Park, Sung Kye; Song, Yun Heub

ArticleIssue Date2017CitationJournal of Nanoscience and Nanotechnology, v.17, no.4, pp 2628 - 2632PublisherAmerican Scientific Publishers
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