Myoung, Seung Joo; Shin, Dong Hyeop; Yang, Tae Jun; Lee, Jae Woo; Eo, Soohong; Kim, Wonjung; Kim, Changwook; Lee, Yoon Jung; Choi, Sung-Jin; Kim, Dong Myong, et al.
ArticleIssue Date2026CitationIEEE Transactions on Electron Devices, v.73, no.5, pp 3050 - 3057PublisherInstitute of Electrical and Electronics Engineers Inc.