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Low-Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO2 Ferroelectric FETsGo to Linkopen access

Koo, Ryun-Han; Shin, Wonjun; Kim, Sangwoo; Kim, Jangsaeng; Kwak, Been; Im, Jiseong; Kim, Hyunwoo; Kwon, Deok-Hwang; Cheema, Suraj S.; Lee, Jong-Ho, et al.

ArticleIssue Date2025CitationAdvanced Science, v.12, no.23, pp 1 - 12PublisherWiley-VCH Verlag
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