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Optimization of Photodiode Design through Analysis of Full-Well Capacity and Image Lag in 0.5 μm CMOS Image Sensors with Vertical Transfer GatesGo to Link

Park, Jae Hyeon; Suk, Chan Hee; Kim, Sungchul; Kim, Jae Ho; Kwon, UiHui; Kim, Dae Sin; Yoo, Keon-Ho; Kim, Tae Whan

ArticleIssue Date2022CitationIEEE Electron Device Letters, v.43, no.10, pp.1697 - 1700PublisherInstitute of Electrical and Electronics Engineers Inc.
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