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The impact of random telegraph signals on the threshold voltage variation of 65 nm multilevel NOR flash memoryGo to Link

Cai, Yimao; Song, Yun Heub; Kwon, Wook-Hyun; Lee, Bong Yong; Park, Chan-Kwang

ArticleIssue Date2008CitationJapanese Journal of Applied Physics, v.47, no.4, pp 2733 - 2735PublisherIOP Publishing Ltd
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