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One-Step Passivation of Both Sulfur Vacancies and SiO2 Interface Traps of MoS2 DeviceGo to Link

Ahn, Byungwook; 김윤석; Kim, Meeree; Yu, Hyang Mi; Ahn, Jaehun; Sim, Eunji; Ji, Hyunjin; Gul, Hamza Zad; Kim, Keun Soo; Ihm, Kyuwook, et al.

ArticleIssue Date2023CitationNano letters, v.23, no.17, pp 7927 - 7933PublisherNLM (Medline)
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