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Control of Transfer Characteristics of Atomic Layer Deposited Al-Doped SnO2 Thin Film through a Post-Annealing ProcessGo to Link

Kim, Byunguk; Park, Hyunwoo; Lee, Sungkwon; 이도욱; 정찬원; Jeon, Hyeongtag

ArticleIssue Date2022CitationECS Journal of Solid State Science and Technology, v.11, no.5, pp 1 - 7PublisherElectrochemical Society, Inc.
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