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Electromigration reliability of Sn-3.0Ag-0.5Cu/Cu-Zn solder jointsGo to Link

Park, Jae-Yong; Lee, Taeyoung; Seo, Wonil; Yoo, Sehoon; Kim, Young-Ho

ArticleIssue Date2019CitationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.30, no.8, pp.7645 - 7653PublisherSPRINGER
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Thalamocortical Structural Covariation Networks Are Related to Familial Risk for Schizophrenia in the Context of Lower Nuclei Volume Estimates in Patients: An ENIGMA StudyGo to Link

Lella, Annalisa; Antonucci, Linda A.; Passiatore, Roberta; Bellantuono, Loredana; Selvaggi, Pierluigi; Popolizio, Teresa; Di Sciascio, Guido; Saponaro, Alessandro; Jo, Hang Joon; Ricci, Patrizia, et al.

ArticleIssue Date2025CitationBiological Psychiatry, v.98, no.9, pp 698 - 711PublisherElsevier BV
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The neural basis of intuitive approximate number system in board game Go (Baduk) expertsGo to Linkopen access

Lee, Taeyoung; Jo, Hang Joon; Kim, Minah; Kwon, Jun Soo

ArticleIssue Date2025CitationScientific Reports, v.15, no.1, pp 1 - 8PublisherNature Publishing Group
SCIESCOPUS
Toward a better measure of functional laterality: Comparing and refining laterality indices in resting-state functional connectivityGo to Linkopen access

Lee, Taeyoung; Kim, Kyung Hwan; Ha, Seo Yeong; Jo, Hang Joon

ArticleIssue Date2026CitationNeuroImage, v.328, pp 1 - 11PublisherAcademic Press Inc.
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