Kim, Tea-Yon; Suh, Eui Hyun; Firestone, Eric; Raithel, Austin L.; Xu, Chunqiang Q.; Ke, Xianglin; Yun, Dong-Jin; Jang, Jaeyoung; McCracken, John; Hamann, Thomas W.
ArticleIssue Date2023CitationChemistry of Materials, v.35, no.17, pp 6726 - 6736PublisherAmerican Chemical Society