Kim, Jae Eun; Muhammad Zeeshan Arshad; Jong, Yoo Seong; Hong, Je Hyeong; Kim, Jinwook; Kim, Young Min
ArticleIssue Date2021Citation2020 25th International Conference on Pattern Recognition (ICPR), pp.2398 - 2405PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC