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A new quantitative Raman measurement scheme using Teflon as a novel intensity correction standard as well as the sample containerGo to Link

Nah, Sanghee; Kim, Donghyuk; Chung, Hoeil; Han, Sung-Hwan; Yoon, Moon-Young

ArticleIssue Date2007CitationJournal of Raman Spectroscopy, v.38, no.5, pp 475 - 482PublisherJohn Wiley & Sons Inc.
SCISCIESCOPUS
Use of peptide for selective and sensitive detection of an Anthrax biomarker via peptide recognition and surface-enhanced Raman scatteringGo to Link

Ryu, Kyungtag; Haes, Amanda J.; Park, Hye-Yeon; Nah, Sanghee; Kim, Joungmok; Chung, Hoeil; Yoon, Moon-Young; Han, Sung-Hwan

ArticleIssue Date2010CitationJournal of Raman Spectroscopy, v.41, no.2, pp 121 - 124PublisherJohn Wiley & Sons Inc.
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