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Deep learning applications in EM imagingGo to Link

Byun, Joong moo; Oh, S; Noh, K; Yoon, D; Seol, SJ

ArticleIssue Date2019Citation81st EAGE Conference and Exhibition 2019 Workshop Programme, pp.1 - 5PublisherEAGE Publishing BV
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Resistivity imaging from electromagnetic data using a fully convolutional networkGo to Link

Oh, S; Noh, K; Yoon, D; Seol, SJ; Byun, Joong moo

ArticleIssue Date2019Citation81st EAGE Conference and Exhibition 2019, v.2019, pp.1 - 5PublisherEAGE Publishing BV
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