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Measuring electrical interfacial resistance of metal using modified transfer length methodGo to Link

Park, Junyoung; Park, Sangyeun; Kim, Hyunwoo; Yoo, Hyeonnam; Koo, Doheon; Kim, Wondo; Na, Hye Seok; Kim, Jangwoo; Park, Hyun Sung; So, Hongyun

ArticleIssue Date2026CitationMEASUREMENT, v.286, pp 1 - 11PublisherELSEVIER SCI LTD
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