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Showing results 1 to 1 of 1
SCOPUS
A Gate-All-Around Back-Gated Junctionless 3D NAND Structure for Improved Switching Efficiency and Variability Suppression
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Min, Seah; Kim, Sohee; Park, Jong Kyung;
Song, Yun-Heub
Article
Issue Date
2026
Citation
2026 IEEE International Memory Workshop, IMW 2026 - Proceedings, pp 1 - 4
Publisher
Institute of Electrical and Electronics Engineers Inc.
1
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